ABSTRACT

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons

chapter 1|32 pages

System Timing

chapter 2|10 pages

ROM/PROM/EPROM

chapter 3|18 pages

SRAM

chapter 4|20 pages

Embedded Memory

chapter 5|42 pages

Flash Memories

chapter 6|16 pages

Dynamic Random Access Memory

chapter 7|38 pages

Low-Power Memory Circuits

chapter 8|30 pages

Timing and Signal Integrity Analysis

chapter 9|16 pages

Microprocessor Design Verification

chapter 10|28 pages

Microprocessor Layout Method

chapter 11|22 pages

Architecture

chapter 12|28 pages

ASIC Design

chapter 14|6 pages

Testability Concepts and DFT

14.1 Introduction: Basic Concepts

chapter 15|14 pages

ATPG and BIST

chapter 16|22 pages

CAD Tools for BIST/DFT and Delay Faults